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Posts posted by attila
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The calculations in the application take in account the probe(s) impedance.
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Hi @PaulGlass
For clock qualifier you could use trigger level + edge.
The bus interpreter has clock, enable, delay options.Click on Protocol with Ctrl key to reveal the advanced trigger which is only documented in the SDK manual. To have examples, first configure a standard trigger (for protocol, pulse...) then open the advanced editor.
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Hi @doggy
Math channels are implemented in the application, so they are not available as trigger source.
The Analog Discovery scope inputs are differential, so you could you use these like: C1 = '1+' - '1-' -
Hi @linear_guy
The checkbox for secondary measurements is available with Adapter. This will perform two measurements toggling the relays of the adapter.
With 4 channel scope (line ADP3450) all the measurements are performed at once. -
Hi @Conrad2468
You could also use the dwfcmd command line app, see WF SDK/ samples/ dwfcmd
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FFT/CZT function is available in WF SDK as C API but you can use similar VIs to process the raw data.
https://forum.digilent.com/topic/20241-labview/
https://www.ni.com/docs/en-US/bundle/labview-api-ref/page/menus/categories/signal-processing/anspectral-mnu.html
https://www.ni.com/docs/en-US/bundle/labview-api-ref/page/menus/categories/signal-processing/antransform-mnu.html -
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Hi @bryan78
You could use Frequency Modulation. Like this goes between 1kHz and 3kHz :
The next version will add sweep shape option:
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Hi @doggy
How does your signal look like ? could you attach a screenshot ?
Have you tried triggering options like: type, hysteresis... or filter channels ? -
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Hi @mms14
Sorry, 6M samples at 100kHz and not the other way around.
14 hours ago, attila said:See WF SDK/ samples/ py/ DigitalIn_Record.py example
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Hi @Shalin
The supply voltage applies to all DIO and DIN channels.
The IO and IN channels have different frontends, see:
https://digilent.com/reference/test-and-measurement/digital-discovery/reference-manual#io_level_translators
https://digilent.com/reference/test-and-measurement/digital-discovery/reference-manual#input_dividers
The SPI and other protocols swap the capture order of IO IN channels, so DIOs are first. To use a DIN channel as MISO configure data 1 to be 16+DINnumber, like FDwfDigitalSpiDataSet(hdwf, 1, 16) for DIN-0 -
Hi @Logan B
For I2S output custom signal can be used from Pattern Generator. Decoding is supported in Logic Analyzer.
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Hi @mms14
Only natural division of system frequency are supported. With the default 100MHz closest would be 5.882MHz.
For 6MHz set system frequency for instance to 120MHz. dwf.FDwfDeviceParamSet(hdwf, DwfParamFrequency, 120000000)See WF SDK/ samples/ py/ DigitalIn_Record.py example
Set number of minimum samples you want to capture before trigger as Prefill and the exact number after trigger as Position.
After the capture is done the data need to be aligned. rgwSamples = rgwSamples[iSample:]+rgwSamples[:iSample]For digital record 6MHz is on the limit to work, buffer overflow may occur.
To improve the record use the 4th or 5th device configuration.
dwf.FDwfDeviceConfigOpen(-1, 3 or 4, byref(hdwf))If the average signal toggle rate is less than 3MHz use data compression. This way you may be able to use even higher record rate, like 120MHz
See DigitalIn_Record_Compress.py example -
Hi @Roche
Thank you for the observation.
Corrected for the next version. -
Hi @Roche
I don't understand where you see Z.
Here 24 is PP drives low/high, 25 OD low/Z, 26 OS Z/high, 27 TS low/high/Z
The uncontrolled DIOs (neither from StaticIO, Patterns, Protocol...) are by default in high impedance.
The Patterns preview is just a preview, with high zoom out or certain situations it may not show the signals correctly.
AVR Programming + WaveForms SDK
in Test and Measurement
Posted
Hi @AaronN
AVR programmer could be implemented using SPI functions.
There is a dedicated (discontinued) AVR programmer which relies on JTAG/SPI cable and modules:
https://digilent.com/reference/software/digilent-avr-programmer/start