USB-TEMP Semiconductor testing

[Brian97224]

Hi All,  I'm testing our USB-TEMP logger before we put it into use and I'm trying to figure out how to simulate a test on the semiconductor function.  Every wring diagram I use is unsuccessful.  Is there a way that I can insert a voltage (and to which connectors?) to each channel to verify the measurements are accurate? Is there a way to substitute the TMP36 conductor for a voltage reference?

[Fausto]

Hello @Brian97224.

Unlike the USB-TEMP-AI device, the USB-TEMP device does not support a voltage input type.

 https://digilent.com/shop/mcc-usb-temp-and-tc-series-temperature-and-voltage-measurement-usb-daq-devices/

 

However, reading the raw millivolts or the raw ohms of a thermistor or RTD channel is supported via the MCC Universal Library using the NOSCALE option; data before being linearized and converted into degrees.

 

 

 

 

Keep in mind the input voltage range depending on the specified sensor category.

 

Regards,

Fausto